CEI EN 62374-1 PDF

Name:
CEI EN 62374-1 PDF

Published Date:
05/01/2012

Status:
[ Active ]

Description:

Semiconductor devices Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

SAME AS IEC 62374-1

This part of IEC 62374 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

Edition :	12
File Size :	1 file , 920 KB
Number of Pages :	24
Published :	05/01/2012

History

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