CEI EN IEC 60749-13 PDF

Name:
CEI EN IEC 60749-13 PDF

Published Date:
08/01/2018

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere

Publisher:
Comitato Elettrotecnico Italiano

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.

The salt atmosphere test is considered destructive.

Edition :	18
File Size :	1 file , 1.8 MB
Number of Pages :	24
Published :	08/01/2018

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