Name:
CEI EN IEC 60749-13 PDF
Published Date:
08/01/2018
Status:
[ Active ]
Publisher:
Comitato Elettrotecnico Italiano
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment.
The salt atmosphere test is considered destructive.
| Edition : | 18 |
| File Size : | 1 file , 1.8 MB |
| Number of Pages : | 24 |
| Published : | 08/01/2018 |
