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CEI EN IEC 60749-41 PDF

CEI EN IEC 60749-41 PDF

Name:
CEI EN IEC 60749-41 PDF

Published Date:
05/01/2021

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices

Publisher:
Comitato Elettrotecnico Italiano

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$17.7
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ENGLISH

This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.


Edition : 21
File Size : 1 file , 2.5 MB
Number of Pages : 30
Published : 05/01/2021

History

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