CID A-A-55485/5C PDF

Published Date: 08/14/2020

MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, LEAD CONVERSION, .200 OR .230 DIAMETER PIN CENTER TO A GRID PATTERN

Published Date: 08/10/2015

MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, LEAD CONVERSION, .200 OR .230 DIAMETER PIN CENTER TO A GRID PATTERN

Published Date: 03/07/2003

MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, LEAD CONVERSION, .200 OR .230 DIAMETER PIN CENTER TO A GRID PATTERN (SUPERSEDING A-A-55485/5)

Published Date: 09/30/1993

MOUNTING PADS, ELECTRICAL-ELECTRONIC COMPONENT, LEAD CONVERSION, .200 TO .230 DIAMETER PIN CENTER TO A GRID PATTERN (S/S BY A-A-55485/5A)

Published Date: 09/01/1995

Standard Conditions for Use Prior to and During the Testing of Solid Electrical Insulating Materials - GERMAN ONLY

Published Date: 08/01/1995

Electromechanical Components for Electronic Equipment - Basic Testing Procedures and Measuring Methods - Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Eelectronic Equipment; Basic Testing Procedures and Measuring Methods; Part 2: General Examination, Electrical Continuity and Contact Resistance Tests, Insulation Tests and Voltage Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 3: Current-Carrying Capacity Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; Part 4: Dynamic Stress Tests - GERMAN ONLY

Published Date: 05/01/1994

Electromechanical Components for Electronic Equipment; Basic Testing Procedures and Measuring Methods; part 5: Impact Tests (Free Components), Static Load Tests (Fixed Components), Endurance Tests and Overload Tests - GERMAN ONLY