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DANSK DS/EN 60749-25 PDF

DANSK DS/EN 60749-25 PDF

Name:
DANSK DS/EN 60749-25 PDF

Published Date:
01/05/2004

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$15.3
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SAME AS IEC 60749-25

This part of IEC 60749 provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses.


Edition : 04
File Size : 1 file , 140 KB
Number of Pages : 19
Product Code(s) : DS-017, DS-017
Published : 01/05/2004

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