Name:
DANSK DS/EN 60749-31+CORR.1 PDF
Published Date:
01/05/2004
Status:
[ Active ]
Publisher:
Dansk Standard
This part of IEC 60749 is applicable to semiconductor device (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to internal heating caused by excessive overloads.
| Edition : | 04 |
| File Size : | 1 file , 150 KB |
| Number of Pages : | 11 |
| Product Code(s) : | DS-009, DS-009 |
| Published : | 01/05/2004 |