Name:
DANSK DS/EN 60749-32+CORR.1 PDF
Published Date:
01/05/2004
Status:
[ Active ]
Publisher:
Dansk Standard
This part of IEC 60749 is applicable to semiconductor device (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
| Edition : | 04 |
| File Size : | 1 file , 160 KB |
| Number of Pages : | 14 |
| Product Code(s) : | DS-013, DS-013 |
| Published : | 01/05/2004 |