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DANSK DS/EN 60749-42 PDF

DANSK DS/EN 60749-42 PDF

Name:
DANSK DS/EN 60749-42 PDF

Published Date:
10/17/2014

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$13.2
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SAME AS IEC 60749-42

IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.


Edition : 14
File Size : 1 file , 1.5 MB
Number of Pages : 14
Product Code(s) : DS-013, DS-013
Published : 10/17/2014

History

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