DANSK DS/EN 60749-4 PDF

Name:
DANSK DS/EN 60749-4 PDF

Published Date:
08/26/2002

Status:
[ Revised ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

SAME AS IEC 60749-4

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semicondutor devices in humid environments.

Edition :	02
File Size :	1 file , 170 KB
Number of Pages :	14
Product Code(s) :	DS-013, DS-013
Published :	08/26/2002

History

Related products

DANSK DS/EN ISO 20456

Published Date: 10/22/2019

Measurement of fluid flow in closed conduits – Guidance for the use of electromagnetic flowmeters for conductive liquids (ISO 20456:2017)

$27

DANSK DS/EN 16274

Published Date: 05/10/2021

Method for analysis of allergens – Quantification of an extended list of 57 suspected allergens in ready to inject fragrance materials by gas chromatography mass spectrometry

$33

DANSK DS/EN 62258-1

Published Date: 11/05/2010

Semiconductor die products - Part 1: Procurement and use

$27

DANSK DS/EN 2591-428

Published Date: 07/08/2002

Aerospace series - Elements of electrical and optical connection - Test methods - Part 428: Sinusoidal vibrations with passage of current for crimped terminal lugs

$8.4