DANSK DS/EN 60749-4 PDF

DANSK DS/EN 60749-4 PDF

Name:
DANSK DS/EN 60749-4 PDF

Published Date:
08/26/2002

Status:
[ Revised ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Publisher:
Dansk Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
dansk-ds-en-60749-4_2714009

Choose Document Language:
13.20 €
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SAME AS IEC 60749-4

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semicondutor devices in humid environments.


Edition : 02
File Size : 1 file , 170 KB
Number of Pages : 14
Product Code(s) : DS-013, DS-013
Published : 08/26/2002

History


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