Name:
DANSK DS/EN 60749-6 PDF
Published Date:
08/26/2002
Status:
[ Withdrawn ]
Publisher:
Dansk Standard
The purpose of this part of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for device qualification. If such devices are used for delivery, the effects of this highly accelerated stress test must be evaluated.
| Edition : | 02 |
| File Size : | 1 file , 140 KB |
| Number of Pages : | 10 |
| Product Code(s) : | DS-009, DS-009 |
| Published : | 08/26/2002 |
