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DANSK DS/EN 60749-8+CORR.2 PDF

DANSK DS/EN 60749-8+CORR.2 PDF

Name:
DANSK DS/EN 60749-8+CORR.2 PDF

Published Date:
12/23/2003

Status:
[ Active ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$18
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SAME AS IEC 60749-8

This part of IEC 60749 is applicable to semiconductor device (discrete devices and integrated circuits). The object of this test method is to determine the leak rate of semiconductor devices.


Edition : 03
File Size : 1 file , 210 KB
Number of Pages : 23
Product Code(s) : DS-021, DS-021
Published : 12/23/2003

History

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