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DANSK DS/EN 62047-18 PDF

DANSK DS/EN 62047-18 PDF

Name:
DANSK DS/EN 62047-18 PDF

Published Date:
10/08/2013

Status:
[ Active ]

Description:

Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
dansk-ds-en-62047-18_2664321
Choose Document Language:
18.00 €
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SAME AS IEC 62047-18

IEC 62047-18:2013 specifies the method for bend testing of thin film materials with a length and width under 1 mm and a thickness in the range between 0,1 micrometre and 10 micrometre. This International Standard specifies the bend testing and test piece shape for micro-sized smooth cantilever type test pieces, which enables a guarantee of accuracy corresponding to the special features.


Edition : 13
File Size : 1 file , 1.6 MB
Number of Pages : 22
Product Code(s) : DS-021, DS-021
Published : 10/08/2013

History

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