DANSK DS/EN 62374-1 PDF

Name:
DANSK DS/EN 62374-1 PDF

Published Date:
02/17/2011

Status:
[ Active ]

Description:

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

IEC 62374-1:2010 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.

Edition :	11
File Size :	1 file , 1 MB
Number of Pages :	22
Product Code(s) :	DS-021, DS-021
Published :	02/17/2011

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DANSK DS/EN 62374-1 PDF

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

History

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