DANSK DS/EN 62416 PDF

Name:
DANSK DS/EN 62416 PDF

Published Date:
06/17/2010

Status:
[ Active ]

Description:

Semiconductor devices - Hot carrier test on MOS transistors

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

SAME AS IEC 62416

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

Edition :	10
File Size :	1 file , 920 KB
Number of Pages :	14
Product Code(s) :	DS-013, DS-013
Published :	06/17/2010

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DANSK DS/EN 62416 PDF

Semiconductor devices - Hot carrier test on MOS transistors

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