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DANSK DS/EN 62417 PDF

DANSK DS/EN 62417 PDF

Name:
DANSK DS/EN 62417 PDF

Published Date:
06/09/2010

Status:
[ Active ]

Description:

Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$13.2
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SAME AS IEC 62417

IEC 62417:2010 provides a wafer level test procedure to determine the amount of positive mobile charge in oxide layers in metal-oxide semiconductor field effect transistors. It is applicable to both active and parasitic field effect transistors. The mobile charge can cause degradation of microelectronic devices, e.g. by shifting the threshold voltage of MOSFETs or by inversion of the base in bipolar transistors.


Edition : 10
File Size : 1 file , 1.4 MB
Number of Pages : 14
Product Code(s) : DS-013, DS-013
Published : 06/09/2010

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