DANSK DS/EN 62418 PDF

DANSK DS/EN 62418 PDF

Name:
DANSK DS/EN 62418 PDF

Published Date:
07/23/2010

Status:
[ Active ]

Description:

Semiconductor devices - Metallization stress void test

Publisher:
Dansk Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
dansk-ds-en-62418_2703320

Choose Document Language:
18.00 €
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SAME AS IEC 62418

IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization.


Edition : 10
File Size : 1 file , 980 KB
Number of Pages : 22
Product Code(s) : DS-021, DS-021
Published : 07/23/2010

History


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