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DANSK DS/EN IEC 60749-41 PDF

DANSK DS/EN IEC 60749-41 PDF

Name:
DANSK DS/EN IEC 60749-41 PDF

Published Date:
09/08/2020

Status:
[ Active ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$19.2
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SAME AS IEC 60749-41

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.


Edition : 20
File Size : 1 file , 2.1 MB
Number of Pages : 30
Product Code(s) : DS-026, DS-026
Published : 09/08/2020

History

DANSK DSF/FPREN IEC 60749-41
DANSK DSF/FPREN IEC 60749-41
Published Date:
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
$12
DANSK DSF/PREN IEC 60749-41
DANSK DSF/PREN IEC 60749-41
Published Date:
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
$12
DANSK DS/EN IEC 60749-41
DANSK DS/EN IEC 60749-41
Published Date: 09/08/2020
Semiconductor devices – Mechanical and climatic test methods – Part 41: Standard reliability testing methods of non-volatile memory devices
$19.2

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