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DANSK DS/IEC 63284 PDF

DANSK DS/IEC 63284 PDF

Name:
DANSK DS/IEC 63284 PDF

Published Date:
04/25/2022

Status:
[ Active ]

Description:

Semiconductor devices – Reliability test method by inductive load switching for gallium nitride transistors

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
dansk-ds-iec-63284_2655144
Choose Document Language:
16.80 €
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IEC 63284:2022 covers the protocol of performing a stress procedure and a corresponding test method to evaluate the reliability of gallium nitride (GaN) power transistors by inductive load switching, specifically hard-switching stress


Edition : 22
File Size : 1 file , 1.4 MB
Number of Pages : 18
Product Code(s) : DS-017, DS-017
Published : 04/25/2022

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