Name:
DANSK DS/IEC TS 62916 PDF
Published Date:
04/18/2017
Status:
[ Active ]
Publisher:
Dansk Standard
IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.
| Edition : | 17 |
| File Size : | 1 file , 830 KB |
| Number of Pages : | 15 |
| Product Code(s) : | DS-013, DS-013 |
| Published : | 04/18/2017 |