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DANSK DSF/FPREN 60749-13 PDF

DANSK DSF/FPREN 60749-13 PDF

Name:
DANSK DSF/FPREN 60749-13 PDF

Published Date:

Status:
[ Draft-Obsolete ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$8.7
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DRAFT

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive


Edition : 17
File Size : 1 file , 890 KB
Number of Pages : 16
Product Code(s) : DSF-009, DSF-009

History

DANSK DSF/FPREN 60749-13
DANSK DSF/FPREN 60749-13
Published Date:
Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere
$8.7
DANSK DS/EN 60749-13
DANSK DS/EN 60749-13
Published Date: 09/23/2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
$11.4

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