DANSK DSF/FPREN 60749-13 PDF

Name:
DANSK DSF/FPREN 60749-13 PDF

Published Date:

Status:
[ Draft-Obsolete ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

Publisher:
Dansk Standard

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

DRAFT

This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive

Edition :	17
File Size :	1 file , 890 KB
Number of Pages :	16
Product Code(s) :	DSF-009, DSF-009

History

DANSK DSF/FPREN 60749-13

Published Date:

Semiconductor devices – Mechanical and climatic test methods – Part 13: Salt atmosphere

$8.7

DANSK DS/EN 60749-13

Published Date: 09/23/2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

$11.4

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