Name:
DANSK DSF/FPREN 60749-3 PDF
Published Date:
Status:
[ Draft ]
Publisher:
Dansk Standard
The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is useful for qualification, process monitor, or lot acceptance, or both.
| Edition : | 16 |
| File Size : | 1 file , 450 KB |
| Number of Pages : | 13 |
| Product Code(s) : | DSF-009, DSF-009 |
