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DANSK DSF/FPREN 60749-43 PDF

DANSK DSF/FPREN 60749-43 PDF

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DANSK DSF/FPREN 60749-43 PDF

Published Date:

Status:
[ Draft ]

Description:

Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans

Publisher:
Dansk Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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$14.7
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DRAFT

This Part of IEC 60749 gives guidelines for reliability qualification plans of semiconductor integrated circuit products(ICs). This Part of IEC 60749 is not intended for military- and space-related applications. NOTE – The manufacturer can use flexible sample size to reduce cost and keep reasonable reliability by this guideline adoptation based on EDR4708. AEC Q100, JESD47 or other relevant document can also be applicable if it is specfied.


Edition : 16
File Size : 1 file , 1.2 MB
Number of Pages : 39
Product Code(s) : DSF-036, DSF-036

History

DANSK DSF/FPREN 60749-43
DANSK DSF/FPREN 60749-43
Published Date:
Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
$14.7
DANSK DS/EN 60749-43
DANSK DS/EN 60749-43
Published Date: 09/04/2017
Semiconductor devices – Mechanical and climatic test methods – Part 43: Guidelines for IC reliability qualification plans
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