DANSK DSF/IEC TS 62804-1-1 ED1 PDF

This part of IEC 62804 defines procedures to test and evaluate for potential-induced degradation-delamination (PID-d) mode in the laminate of crystalline silicon PV modules– principally those with one or two glass faces. This Technical Specification (TS) evaluates delamination attributable to current transfer between ground and module. Elements driving the delamination that this test is designed to actuate include reduced adhesion associated with damp heat exposure, sodium accumulation at the cell surface, and cathodic gas evolution driven by the voltage potential in the active cell circuit, metallization, and other components within the PV module. The change in power of crystalline silicon PV modules associated with the stress factors applied (the purview of IEC TS 62804-1) is not considered in the scope.