DANSK DSF/PREN IEC 61000-4-20 PDF

This part of IEC 61000 pertains to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example striplines and electromagnetic pulse simulators) and closed structures (for example TEM cells). These structures can be further classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe – TEM waveguide characteristics, including typical frequency ranges and equipment-under- test (EUT) size limitations; – TEM waveguide validation methods for electromagnetic compatibility (EMC) tests; – the EUT (i.e. EUT cabinet and cabling) definition; – test set-ups, procedures, and requirements for radiated emission measurements in TEM waveguides; and – test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.