DANSK DSF/PREN IEC 61010-031 PDF

1.1.1 Probe assemblies included in scope This part of IEC 61010 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for non-contact or direct electrical connection between a part and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment. a) Type A: non-attenuating probe assemblies that are RATED for direct connection to voltages exceeding 30 V AC RMS, 42,4 V peak, or 60 V DC, but not exceeding 63 kV AC RMS or DC. They do not incorporate components which are intended to provide a voltage divider function or a signal conditioning function, but they may contain non-attenuating components such as fuses (see Figure 1.) b) Type B: attenuating or divider probe assemblies that are RATED for direct connection to voltages exceeding 30 V AC RMS or 60 DC but not exceeding 63 kV AC RMS or DC. The divider function may be carried out wholly within the probe assembly, or partly within the test or measurement equipment to be used with the probe assembly (see Figure 2.a and Figure 2.b). c) Type D: attenuating, non-attenuating or other signal conditioning probe assemblies, that are RATED for direct connection only to voltages not exceeding 30 V AC RMS, or 42,4 V peak, or 60 V DC, and are suitable for currents exceeding 8 A AC RMS or DC (see Figure 3). d) Type E: non-attenuating probe assemblies for 4-pole precise resistance measurements in electrical installation (see Figure 4). EXAMPLE: Kelvin probes. e) Type F: probe assemblies for non-contact AC voltage test and measurement. These probe assemblies are intended for use on non-insulated conductors without electrical contact (see Figure 5). NOTE – Type F probe assemblies can be stand-alone probes or connected by a PROBE WIRE to an equipment