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DANSK DSF/PREN IEC 63287-1 PDF

DANSK DSF/PREN IEC 63287-1 PDF

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DANSK DSF/PREN IEC 63287-1 PDF

Published Date:

Status:
[ Draft-Obsolete ]

Description:

Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for LSI reliability qualification

Publisher:
Dansk Standard

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Active
Format:
Electronic (PDF)
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10 minutes
Delivery time (for Russian version):
200 business days
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$14.7
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DRAFT * W/D S/S BY DS/EN IEC 63287-1

This part of IEC 63287-1 gives guidelines for reliability qualification plans of large scale semiconductor integrated circuit products (LSI). This document is not intended for military- and space-related applications. NOTE 1 – The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 – The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.


Edition : 20
File Size : 1 file , 1.4 MB
Number of Pages : 44
Product Code(s) : DSF-036, DSF-036

History

DANSK DSF/PREN IEC 63287-1
DANSK DSF/PREN IEC 63287-1
Published Date:
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for LSI reliability qualification
$14.7
DANSK DS/EN IEC 63287-1
DANSK DS/EN IEC 63287-1
Published Date: 10/05/2021
Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for IC reliability qualification
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