DIN 50451-3 PDF

Published Date: 11/01/2014

Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS

Published Date: 11/01/2012

Draft Document - Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Aluminium (Al), Arsenic (As), Barium (Ba), Beryllium (Be), Bismuth (Bi), Calcium (Ca), Cadmium (Cd), Cobalt (Co), Chromium (Cr), Copper (Cu), Iron (Fe), Gallium (Ga), Germanium (Ge), Hafnium (Hf), Indium (In), Potassium (K), Lithium (Li), Magnesium (Mg), Manganese (Mn), Molybdenum (Mo), Nickel (Ni), Niobium (Nb), Lead (Pb), Antimony (Sb), Tin (Sn), Strontium (Sr), Tantalum (Ta), T...

Published Date: 04/01/2003

Determination of traces of elements in liquids for use in semiconductor technology - Part 3: Determination of aluminium, cobalt, copper, nickel, sodium and zinc in nitric acid by inductively-coupled plasma mass spectrometry (ICP-MS)

Published Date: 06/01/1987

Miniature fuses; indicating fuse-links 250 V, non interchangeable, quick acting (F)

Published Date: 10/01/1974

Cast Metal Joint Boxes for Power Cables up to 10 kV; Internal Design for Plastic Insulated Cables 0.6/1 kV

Published Date: 01/01/1973

Conductors and connectors in substations with a nominal voltage of 60 kV and upwards; terms of referances

Published Date: 2011