DIN EN 60747-16-4 PDF

Published Date: 04/01/2018

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009 + A2:2017); German version EN 60747-16-4:2004 + A1:2011 + A2:2017

Published Date: 08/01/2011

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009); German version EN 60747-16-4:2004 + A1:2011

Published Date: 03/01/2005

Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004); German version EN 60747-16-4:2004

Published Date: 01/01/2003

Connectors for electronic equipment - Tests and measurements - Part 2-1: Electrical continuity and contact resistance tests; Test 2a: Contact resistance; Millivolt level method (IEC 60512-2-1:2002); German version EN 60512-2-1:2002

Published Date: 09/01/1986

Fixed resistors for use in electronic equipment; sectional specification: fixed resistor networks with individually measurable resistors; identical with IEC 60115-6, edition 1983

Published Date: 11/01/1991

Fixed capacitors for use in electronic equipment; part 15: blanc detail specification: fixed tantalum capacitors with solid electrolyte and porous anode; assessment level E; identical with IEC 60384-15-3:1984

Published Date: 12/01/2023

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - Device and subassembly (IEC 60749-10:2022); German version EN IEC 60749-10:2022

Published Date: 02/01/2016

(CHINESE - TRADITIONAL) Data Centre Operations Standard

Published Date: 05/01/2016

(SPANISH) Estándar de Operaciones de Centros de Datos

Published Date: 10/01/2021

Data Centre Operations Standard

Published Date: 02/01/2016

(ENGLISH) Data Centre Operations Standard