DIN EN 60749-13 PDF

Published Date: 10/01/2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018); German version EN IEC 60749-13:2018

Published Date: 07/01/2017

Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 47/2377/CDV:2017); German version prEN 60749-13:2017

Published Date: 04/01/2003

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002); German version EN 60749-13:2002

Published Date: 01/01/1994

Harmonized system of quality assessment for electronic components; detail specification: Polar aluminium electrolytic capacitors with non solid electrolyte, DC 40 to 100 V (suitable to V a.c. load without using a polarizing potential), general-purpose grade, cylindrical metal case with insulation sleeve, axial wire leads, climatic category 40/085/56 (CECC 30301-045)

Published Date: 05/01/1991

Harmonized system of quality assessment for electronic components; detail specification: fixed capacitors of ceramic dielectric, class 2; assessment level P

Published Date: 07/01/1995

Blank detail specification: Light emitting diodes and infrared emitting diodes for fibre optic system or sub-system; German version EN 120008:1993

Published Date: 11/01/2000

Lasers and laser-related equipment - Determination of laser-induced damage threshold of optical surfaces - Part 1: 1-on-1 test (ISO 11254-1:2000); English version of DIN EN ISO 11254-1

Published Date: 01/01/1989

Published Date: 11/01/1997

Published Date: 01/01/1991

Published Date: 10/01/1997

Published Date: 01/01/1996