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DIN EN 60749-38 PDF

DIN EN 60749-38 PDF

Name:
DIN EN 60749-38 PDF

Published Date:
10/01/2008

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008

Publisher:
DIN-adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$20.274
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File Size : 1 file
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 14
Product Code(s) : 1459861, 1459861
Published : 10/01/2008

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