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DIN EN 62047-18 PDF

DIN EN 62047-18 PDF

Name:
DIN EN 62047-18 PDF

Published Date:
04/01/2014

Status:
Active

Description:

Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013); German version EN 62047-18:2013

Publisher:
DIN-adopted European Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$29.103
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File Size : 1 file
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 15
Product Code(s) : 2088294, 2088294
Published : 04/01/2014

History

DIN EN 62047-18
DIN EN 62047-18
Published Date: 04/01/2014
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (IEC 62047-18:2013); German version EN 62047-18:2013
$29.103
DIN EN 62047-18 - DRAFT
DIN EN 62047-18 - DRAFT
Published Date: 06/01/2011
Draft Document - Semiconductor devices - Micro-electromechanical devices - Part 18: Bending test methods of thin film materials (IEC 47F/76/CD:2011)
$22.236

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