DIN EN 62326-4 PDF

Published Date: 05/01/1998

Connectors with assessed quality, for use in d.c. low-frequency analogue and in digital high-speed data applications - Part 3: Rectangular connectors; Section 101: Detail specification for a range of shielded connectors with trapezoidal shaped shells and non-removable rectangular contacts on a 1.27 × 2.54 mm centre-line (IEC 61076-3-101:1997); German version EN 61076-3-101:1997

Published Date: 12/01/1994

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification; qualification approval; identical with IEC 61253-2:1993

Published Date: 11/01/2017

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749-4:2017); German version EN 60749-4:2017

Published Date: 01/01/2012

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2011); German version EN 60749-29:2011

Published Date: 2013