DIN EN IEC 60749-18 PDF

DIN EN IEC 60749-18 PDF

Name:
DIN EN IEC 60749-18 PDF

Published Date:
02/01/2020

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019

Publisher:
DIN-adopted European Standard

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Czech version):
200 business days

SKU:
din-en-iec-60749-18_2100665

Choose Document Language:
32.70 €
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File Size : 1 file
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 25
Product Code(s) : 3120362, 3120362
Published : 02/01/2020

History

DIN EN IEC 60749-18
Published Date: 02/01/2020
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019
32.70 €
DIN EN 60749-18 - DRAFT
Published Date: 10/01/2018
Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 47/2468/CDV:2018); German and English version prEN 60749-18:2018
35.32 €
DIN EN 60749-18
Published Date: 09/01/2003
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002); German version EN 60749-18:2003
24.53 €

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DIN EN 60749-21
Published Date: 01/01/2012
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 60749-21:2011); German version EN 60749-21:2011
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DIN IEC 62047-11 - DRAFT
Published Date: 06/01/2010
Draft Document - Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for linear thermal expansion coefficients of MEMS materials (IEC 47F/49/CD:2010)
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