Low prices! Originals & Translations! Save your budget and time!
ONLINENORMS: Online Standards Store
Click View Shopping Cart
  1. Home
  2. DIN
  3. DIN EN ISO 20567-1 PDF

DIN EN ISO 20567-1 PDF

DIN EN ISO 20567-1 PDF

Name:
DIN EN ISO 20567-1 PDF

Published Date:
07/01/2017

Status:
Active

Description:

Paints and varnishes - Determination of stone-chip resistance of coatings - Part 1: Multi-impact testing (ISO 20567-1:2017)

Publisher:
DIN-adopted European-adopted ISO Standard

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$33.681
Need Help?

File Size : 1 file , 1.5 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 21
Product Code(s) : 2688251, 2534556, 2688251, 2534556
Published : 07/01/2017
Same As : DIN EN ISO 20567-1

History

DIN EN ISO 20567-1
DIN EN ISO 20567-1
Published Date: 07/01/2017
Paints and varnishes - Determination of stone-chip resistance of coatings - Part 1: Multi-impact testing (ISO 20567-1:2017)
$33.681
DIN EN ISO 20567-1 - DRAFT
DIN EN ISO 20567-1 - DRAFT
Published Date: 11/01/2014
Draft Document - Paints and varnishes - Determination of stone-chip resistance of coatings - Part 1: Multi-impact testing (ISO/DIS 20567-1:2014); German version prEN ISO 20567-1:2014
$24.525

Related products

DIN ISO 6713
DIN ISO 6713
Published Date: 10/01/1985
Paints and varnishes; preparation of acid extracts from paints in liquid or powder form; identical with ISO 6713, edition 1984
$15.696
DIN EN ISO 10890
DIN EN ISO 10890
Published Date: 02/01/2011
Paints and varnishes - Modelling of biocide release rate from antifouling paints by mass-balance calculation (ISO 10890:2010)
$25.179
DIN EN ISO 22553-7
DIN EN ISO 22553-7
Published Date: 11/01/2021
Paints and varnishes - Electro-deposition coatings - Part 7: Electrical wet-film resistance (ISO 22553-7:2020)
$30.738

Best-Selling Products

JEDEC EIA 318-B
JEDEC EIA 318-B
Published Date: 07/01/1996
MEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
$17.7
JEDEC EIA 323 (R2002)
JEDEC EIA 323 (R2002)
Published Date: 03/01/1966
AIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
$15.3
JEDEC EIA 365 (R1984)
JEDEC EIA 365 (R1984)
Published Date: 11/01/1969
PERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE
$17.7
JEDEC EIA 397-1
JEDEC EIA 397-1
Published Date: 07/01/1980
ADDENDUM No. 1 TO EIA-397
$31.8
JEDEC EIA 397
JEDEC EIA 397
Published Date: 06/01/1972
RECOMMENDED STANDARD FOR THYRISTORS
$68.4
JEDEC EIA 557B
JEDEC EIA 557B
Published Date: 02/01/2006
STATISTICAL PROCESS CONTROL SYSTEMS
$22.2