Name:
ECIA EIA-364-32F PDF
Published Date:
06/01/2011
Status:
[ Revised ]
Publisher:
Electronic Components Industry Association
This test is conducted for the purpose of determining the resistance of a given electrical connector or socket to exposure at extremes of high and low temperatures and to the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application.
NOTE — This procedure includes the provision for testing at cryogenic temperatures. Cryogenic temperatures should only be used with specimens specifically designed to be compatible with such temperatures.
| ANSI : | ANSI Approved |
| Edition : | F |
| File Size : | 1 file , 200 KB |
| Number of Pages : | 20 |
| Published : | 06/01/2011 |
