ECIA EIA-970 PDF

Name:
ECIA EIA-970 PDF

Published Date:
07/01/2013

Status:
[ Revised ]

Description:

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

Publisher:
Electronic Components Industry Association

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.

ANSI :	ANSI Approved
Edition :	13
File Size :	1 file , 740 KB
Number of Pages :	26
Published :	07/01/2013

History

ECIA EIA-970

Published Date: 07/01/2013

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

$26.7

ECIA EIA-970

Published Date: 07/01/2013

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

$4.5

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