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ECIA EIA-970 PDF

ECIA EIA-970 PDF

Name:
ECIA EIA-970 PDF

Published Date:
07/01/2013

Status:
[ Revised ]

Description:

Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors

Publisher:
Electronic Components Industry Association

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Czech version):
200 business days
SKU:
ecia-eia-970_2585089
Choose Document Language:
4.50 €
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This test method is used to measure the S parameters of low-inductance multilayer ceramic capacitors when mounted in shunt on a probeable low inductance test fixture.


ANSI : ANSI Approved
Edition : 13
File Size : 1 file , 740 KB
Number of Pages : 26
Published : 07/01/2013

History

ECIA EIA-970
ECIA EIA-970
Published Date: 07/01/2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
26.70 €
ECIA EIA-970
ECIA EIA-970
Published Date: 07/01/2013
Test Procedure for High Frequency Characterization of Low Inductance Multilayer Ceramic Chip Capacitors
4.50 €

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