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ESD SP5.3.3-2018 PDF

ESD SP5.3.3-2018 PDF

Name:
ESD SP5.3.3-2018 PDF

Published Date:
2018

Status:
Active

Description:

Charged Device Model (CDM) Testing - Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method

Publisher:
EOS/ESD Association, Inc.

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$45
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ESD SP5.3.3-2018 establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices can be characterized according to this standard practice.
ANSI : ANSI Approved
File Size : 1 file , 640 KB
Note : This product is unavailable in Russia, Ukraine, Belarus
Number of Pages : 28
Published : 2018

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