Charged Device Model (CDM) Testing - Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method

Publisher:
EOS/ESD Association, Inc.

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

ESD SP5.3.3-2018 establishes the procedure for testing devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM electrostatic discharge (ESD). All packaged semiconductor devices, thin film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices can be characterized according to this standard practice.

ANSI :	ANSI Approved
File Size :	1 file , 640 KB
Note :	This product is unavailable in Russia, Ukraine, Belarus
Number of Pages :	28
Published :	2018

ESD SP5.3.3-2018 PDF

Charged Device Model (CDM) Testing - Component Level Low-Impedance Contact CDM as an Alternative CDM Characterization Method

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