Name:
ESD SP5.3.4-2022 PDF
Published Date:
2022
Status:
Active
Publisher:
EOS/ESD Association, Inc.
This document establishes a procedure for testing components and microcircuits, such as integrated circuits, discrete semiconductor components, and electronic modules containing more than a single component, according to its susceptibility (sensitivity) to damage or degradation by exposure to a defined contact CDM like electrostatic discharge (ESD). This contact-based test method can be performed on packaged devices as well as on bare dies and wafers.
| ANSI : | ANSI Approved |
| File Size : | 1 file , 590 KB |
| ISBN(s) : | 1585373451 |
| Note : | This product is unavailable in Russia, Ukraine, Belarus |
| Number of Pages : | 24 |
| Published : | 2022 |
