ESD SP5.4.1-2022 PDF

Name:
ESD SP5.4.1-2022 PDF

Published Date:
2022

Status:
Active

Description:

For Latch-up Sensitivity Testing of CMOS/BiCMOS Integrated Circuits Transient Latch-up Testing Device Level

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This document defines procedures to characterize the latch-up sensitivity of integrated circuits triggered by fast transients.

ANSI :	ANSI Approved
File Size :	1 file , 820 KB
ISBN(s) :	1585373427
Note :	This product is unavailable in Russia, Ukraine, Belarus
Number of Pages :	31
Published :	2022

Published Date: 2022

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