BS IEC 62396-2:2017 PDF

BS IEC 62396-2:2017 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth?s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes.


Cross References:
IEC 62396-1:2016
IEC 62396-4
IEC 60749-44
IEC 62396-3
IEC 62396-5
IEC 60749-38


All current amendments available at time of purchase are included with the purchase of this document.

File Size :	1 file , 1.6 MB
ISBN(s) :	9780580965746
Number of Pages :	44
Product Code(s) :	30352477, 30352477, 30352477
Published :	01/11/2018