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IEC 60748-20-1 Ed. 1.0 b:1994 PDF

IEC 60748-20-1 Ed. 1.0 b:1994 PDF

Name:
IEC 60748-20-1 Ed. 1.0 b:1994 PDF

Published Date:
03/01/1994

Status:
Active

Description:

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
SKU:
Choose Document Language:
$70.2
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The purpose of these examinations is to check the internal materials, construction and workmanship of film and hybrid integrated circuits (F and HFICs). These examinations will normally be used prior to tapping or encapsulation to detect and eliminate the F and HFICs with internal defects that could lead to device failure in normal application. Other acceptance criteria may be agreed upon with the purchaser or supplier, respectively.
Edition : 1.0
File Size : 1 file , 2 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 55
Published : 03/01/1994

History

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