IEC 60749-23 Ed. 1.0 b:2004 PDF

Name:
IEC 60749-23 Ed. 1.0 b:2004 PDF

Published Date:
02/23/2004

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Edition :	1.0
File Size :	1 file , 500 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	17
Published :	02/23/2004

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IEC 60749-23 Ed. 1.0 b:2004 PDF

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

History

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