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IEC 60749-24 Ed. 1.0 b:2004 PDF

IEC 60749-24 Ed. 1.0 b:2004 PDF

Name:
IEC 60749-24 Ed. 1.0 b:2004 PDF

Published Date:
03/09/2004

Status:
Active

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$15.3
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The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
Edition : 1.0
File Size : 1 file , 470 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 19
Published : 03/09/2004

History

IEC 60749-24 Ed. 1.0 b:2005
IEC 60749-24 Ed. 1.0 b:2005
Published Date: 11/21/2005
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
$15.3
IEC 60749-24 Ed. 1.0 b:2004
IEC 60749-24 Ed. 1.0 b:2004
Published Date: 03/09/2004
Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
$15.3

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