IEC 60749-3 Ed. 1.0 b:2002 PDF

Name:
IEC 60749-3 Ed. 1.0 b:2002 PDF

Published Date:
04/09/2002

Status:
[ Withdrawn ]

Description:

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.

Edition :	1.0
File Size :	1 file , 360 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	7
Published :	04/09/2002

History

IEC 60749-3 Ed. 2.0 b:2017

Published Date: 03/03/2017

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

$15.3

IEC 60749-3 Ed. 1.0 b CORR1:2003

Published Date: 08/12/2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination

Free Download

IEC 60749-3 Ed. 1.0 b:2002

Published Date: 04/09/2002

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection

$3.6

Related products

IEC 60747-14-1 Ed. 2.0 b:2010

Published Date: 01/21/2010

Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors

$57

IEC 60191-1 Ed. 3.0 en:2018

Published Date: 01/23/2018

Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices

$83.4

IEC 60749-37 Ed. 2.0 b:2022

Published Date: 10/01/2022

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

$57

Best-Selling Products

IEEE/ANSI 101-1987

Published Date: 12/31/1988

IEEE Guide for the Statistical Analysis of Thermal Life Test Data

$67.2

IEEE/ANSI 18-1980

Published Date: 12/15/1980

IEEE Standard for Shunt Power Capacitors

$23.4

IEEE/ANSI 213-1961

Published Date: 04/06/1961

ANSI/IEEE Radio Interference: Methods of Measurement of Conducted Interference Output to the Power Line from FM and Television Broadcast Receivers in the Range of 300 kHz to 25 MHz

$16.5