Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test

Publisher:
International Electrotechnical Commission

Document status:

Active

Format:

Electronic (PDF)

Delivery time:

10 minutes

Delivery time (for Russian version):

200 business days

SKU:

Applies to capacitors according to IEC 60931-1 and gives the requirements for the ageing test and destruction test for these capacitors. The two ageing test methods are intended to ensure that the capacitor case temperature is maintained constant during the test. The destruction test is performed to evaluate the behaviour of the capacitor at the end of its life.

Edition :	2.0
File Size :	1 file , 770 KB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	17
Published :	12/13/1995

IEC 60931-2 Ed. 2.0 b:1995 PDF

Shunt power capacitors of the non-self-healing type for a.c. systems having a rated voltage up to and including 1000 V - Part 2: Ageing test and destruction test

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