IEC 61163-1 Ed. 1.0 b:1995 PDF

IEC 61163-1 Ed. 1.0 b:1995 PDF

Name:
IEC 61163-1 Ed. 1.0 b:1995 PDF

Published Date:
08/14/1995

Status:
[ Withdrawn ]

Description:

Reliability stress screening - Part 1: Repairable items manufactured in lots

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

SKU:

Choose Document Language:
$57.3
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These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.
Edition : 1.0
File Size : 1 file , 5.8 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 153
Published : 08/14/1995

History

IEC 61163-1 Ed. 2.0 b:2006
Published Date: 06/26/2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
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IEC 61163-1 Ed. 1.0 b:1995
Published Date: 08/14/1995
Reliability stress screening - Part 1: Repairable items manufactured in lots
$57.3

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