IEC 61164 Ed. 2.0 en:2004 PDF

IEC 61164 Ed. 2.0 en:2004 PDF

Name:
IEC 61164 Ed. 2.0 en:2004 PDF

Published Date:
03/24/2004

Status:
Active

Description:

Reliability growth - Statistical test and estimation methods

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$72.9
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Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.
Edition : 2.0
File Size : 1 file , 780 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 55
Published : 03/24/2004

History

IEC 61164 Ed. 2.0 b:2004
Published Date: 03/24/2004
Reliability growth - Statistical test and estimation methods
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IEC 61164 Ed. 2.0 en:2004
Published Date: 03/24/2004
Reliability growth - Statistical test and estimation methods
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