IEC 61445 Ed. 1.0 en:2012 PDF

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

Edition :	1.0
File Size :	1 file , 1.8 MB
Note :	This product is unavailable in Ukraine, Russia, Belarus
Number of Pages :	101
Published :	06/21/2012