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IEC 61967-4 Ed. 1.1 b:2006 PDF

IEC 61967-4 Ed. 1.1 b:2006 PDF

Name:
IEC 61967-4 Ed. 1.1 b:2006 PDF

Published Date:
07/27/2006

Status:
[ Withdrawn ]

Description:

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION

Publisher:
International Electrotechnical Commission

Document status:
Active
Format:
Electronic (PDF)
Delivery time:
10 minutes
Delivery time (for Russian version):
200 business days
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Choose Document Language:
$96.9
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Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
Edition : 1.1
File Size : 1 file , 2.4 MB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 65
Published : 07/27/2006

History

IEC 61967-4 Ed. 2.0 b:2021
IEC 61967-4 Ed. 2.0 b:2021
Published Date: 03/30/2021
Integrated Circuits - Measurement Of Electromagnetic Emissions - Part 4: Measurement Of Conducted Emissions - 1 Ohm/150 Ohm Direct Coupling Method
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IEC 61967-4 Ed. 1.1 b:2006
IEC 61967-4 Ed. 1.1 b:2006
Published Date: 07/27/2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ¿¿/150 ¿¿ direct coupling method CONSOLIDATED EDITION
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IEC 61967-4 Ed. 1.0 b:2002
IEC 61967-4 Ed. 1.0 b:2002
Published Date: 04/30/2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
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