IEC 62047-14 Ed. 1.0 b:2012 PDF

IEC 62047-14 Ed. 1.0 b:2012 PDF

Name:
IEC 62047-14 Ed. 1.0 b:2012 PDF

Published Date:
02/28/2012

Status:
Active

Description:

Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials

Publisher:
International Electrotechnical Commission

Document status:
Active

Format:
Electronic (PDF)

Delivery time:
10 minutes

Delivery time (for Russian version):
200 business days

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$43.5
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IEC 62047-14:2012 describes definitions and procedures for measuring the forming limit of metallic film materials with a thickness range from 0,5 μm to 300 μm. The metallic film materials described herein are typically used in electric components, MEMS and micro-devices. When metallic film materials used in MEMS (see 2.1.2 of IEC 62047-1:2005) are fabricated by a forming process such as imprinting, it is necessary to predict the material failure in order to increase the reliability of the components. Through this prediction, the effectiveness of manufacturing MEMS components by a forming process can also be improved, because the period of developing a product can be reduced and manufacturing costs can thus be decreased. This standard presents one of the prediction methods for material failure in imprinting process.
Edition : 1.0
File Size : 1 file , 530 KB
Note : This product is unavailable in Ukraine, Russia, Belarus
Number of Pages : 34
Published : 02/28/2012

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